Gaya APA
Barrett, Jim, Williams, Geoff. (2001).
Test your own aptitude : ujilah bakat profesional anda (Cet. 2, 2001).
Jakarta:
Erlangga.
Gaya Chicago
Barrett, Jim, Williams, Geoff.
Test your own aptitude : ujilah bakat profesional anda.
Cet. 2, 2001
Jakarta:
Erlangga,
2001.
Text.
Gaya MLA
Barrett, Jim, Williams, Geoff.
Test your own aptitude : ujilah bakat profesional anda.
Cet. 2, 2001
Jakarta:
Erlangga,
2001.
Text.
Gaya Turabian
Barrett, Jim, Williams, Geoff.
Test your own aptitude : ujilah bakat profesional anda.
Cet. 2, 2001
Jakarta:
Erlangga,
2001.
Print.